Dr. Cheng-Wen Wu
General Director of ITRI/ICL & VP of ITRI
Cheng-Wen Wu received the BSEE degree from National Taiwan University, Taipei, Taiwan, in 1981, and the MS and PhD degrees in electrical and computer engineering from the University of California, Santa Barbara (UCSB), in 1985 and 1987, respectively. Since 1988, he has been with the Department of Electrical Engineering, National Tsing Hua University (NTHU), Hsinchu, Taiwan, where he is currently a Tsing Hua Chair Professor. He also serves as the Vice President and General Director of Information and Communications Research Laboratories (ICL) at ITRI. At NTHU, he has served as the Director of Computer and Communications Center from 1996 to 1998, and the Director of Technology Service Center from 1998 to 1999. From August 1999 to February 2000, he was a Visiting Scholar with the ECE Department at UCSB. He then served as the Chair of EE Department from 2000 to 2003, Director of IC Design Technology Center from 2000 to 2005, and Dean of the College of EECS from 2004 to 2007. Dr. Wu was the General Director of SOC Technology Center (STC) at ITRI from 2007 to 2009, before he architected the merger of STC and ICL. He is leading the integrated organization that covers information technologies, communications technologies, as well as IC design technologies. He also is the Chair of IC Design Committee, Taiwan Semiconductor Industry Association (TSIA).
Dr. Wu was the Technical Program Chair of the IEEE 5th Asian Test Symposium (ATS’96), the General Chair of ATS’00, the General Co-Chair of the IEEE Memory Technology, Design, and Testing Workshop (MTDT) in 2005, 2006, 2007, and 2009, the Organizing Committee Chair of the IEEE Asian Solid-State Circuit Conference (A-SSCC) in 2009, and the General Co-Chair of the IEEE Int. Symp. on VLSI Design, Automation, and Test (VLSI-DAT) in 2008 and 2009. Dr. Wu was the Editor-in-Chief for the International Journal of Electrical Engineering (IJEE) and subsequently Chair of its Editorial Board. He is an Editor for the Journal of Electronic Testing: Theory and Applications (JETTA), an Editor for IEEE Design and Test of Computers, an Associate Editor for IEEE Transactions on Computers, and an Associate Editor for IEEE Transactions on CAD.
Dr. Wu is a recipient of the Distinguished Teaching Awards (twice) from NTHU, the Outstanding Electrical Engineering Professor Award from the Chinese Institute of Electrical Engineers (CIEE), the Distinguished Research Awards (three times) from National Science Council, the Industrial Collaboration Awards (twice) from the Ministry of Education (MOE), the Best Paper Award of the 2002 IEEE International Workshop on Design & Diagnostics of Electronic Circuits & Systems, the Best Paper Award of the 2003 IEEE Asia & South Pacific Design Automation Conference (ASP-DAC), the Special Feature Award of the 2003 ASP-DAC University LSI Design Contest, the Academic Award from MOE, the Continuous Service Award and Outstanding Contribution Award from the IEEE Computer Society, the IEEE VLSI Test Symposium (VTS) Best Innovative Practices Session Award from TTTC, IEEE Computer Society, the Distinguished Industrial Collaboration Award from NTHU, the National Invention Award (Silver Medal) from Ministry of Economic Affairs, the Best Paper Award of the 2007 VLSI Design and Computer-Aided Design Symposium, and the TECO Award. He became a Golden Core Member of the IEEE Computer Society in 2006. His research interests include design and test of high performance VLSI circuits and systems, and test and repair of memory circuits. He is a life member of the CIEE, a life member of Taiwan IC Design Society, and a Fellow of the IEEE.